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Defect Detection Via Thz Imaging: Potentials and Limitations

SKU: 9783639103694

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Defect Detection Via Thz Imaging: Potentials and Limitations, Mikhail I. Dyakonov, 9783639103694

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Until recent years, terahertz waves were an undiscovered, or most importantly, an unexploited area of electromagnetic spectrum. Recent advances in hardware have started to open up the eld to new applications such as THz imaging. This non destructive technology can penetrate through diverse material such that the internal structure which is invisible to other imaging modalities, can be visualized. However, automated processing of THz images can be quite challenging. Low contrast and the presence of a widely unknown type of noise make the analysis of these images difficult. Therefore, pre-processing techniques are required for further investigations. Kaveh Houshmand was born in 1982. He moved to Canada with his family when he was 14 years old. After finishing his high school, he attended Queen’s University for electrical engineering. He just finished his masters in systems design program specialized in image processing at University of Waterloo.

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